Generation mean analysis for yield attributing traits in mungbean [Vigna radiata (L.) Wilczek]

Abstract

The inheritance of genetic parameters in mungbean [Vigna radiata (L) Wilczek] were studied from six generations of four crosses namely ML 1271 x MUL 81, VC 6370-30-65 x MUL 81, ML 1271 x LM 51 and VC 6370-30-65 x LM 51 by using generation mean analysis. Six generations of these crosses viz. Pl' P2' F1, F2, B1 and B2 were grown in a randomized block design with three replications during kharif 2003. Each parent, Fl' B1 and B2 were grown in single row of 4m length, while F2 were grown in four rows of 4m length. Inter and intra-row spacings were kept 45 cm and 10 cm, respectively. Observations were recorded on different yield attributing traits namely days to 50 % flowering, days to maturity, plant height, branches per plant, clusters per plant, pods per plant, seeds per pod, grain yield per plant and 100-grain weight on single plant basis on 5 randomly selected plants in Pl' P2 and F1; 10 plants in B1 and B2 and 20 plants for F2 generation of each cross. The data were first subjected to A, Band C scaling tests to detect presence of epistasis and then the epistatic model given by Hayman [1] was used for estimation of gene effects.