GGE biplot analysis of genotype × environment interaction in rabi grain sorghum [Sorghum bicolor (L.) Moench]
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Abstract
Nature and complexity of genotype × environment interaction (GEI) was studied among eight rabi grain sorghum cultivars across 11 locations during rabi 201112 and 201213 using GGE biplot analysis. Location (L) contributed for 89.9% of variation for grain yield, while genotypes (G) and G × L interactions accounted for 1% and 9% of variation only. The first two principal components (PCs) of GGE biplot accounted for 50% of variation in data for grain yield, which not ideally explained overall variation in the data. However, the biplot clearly demonstrated that across environments, SPH 1721 was the highest yielding stable genotype followed by CSH 15R. High crossover GEI was recorded among the testing locations and close correlation among these locations was not detected. ‘Which-won-where’ analysis detected three mega-environments (ME) among the testing locations, with ME1 represented by 5 locations, ME2 with 4 locations and ME3 with 2 locations. The study indicated the possibility to reduce the number of testing locations.
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Rakshit, S., Ganapathy, K. N., Gomashe, S. S., Swapna, M., More, A., Gadakh, S. R., Ghorade, R. B., Kajjidoni, S. T., Solanki, B. G., Biradar, B. D., & Prabhakar. (2014). GGE biplot analysis of genotype × environment interaction in rabi grain sorghum [Sorghum bicolor (L.) Moench]. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, 74(Suppl.), 558–563. https://doi.org/10.5958/0975-6906.2014.00889.X
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Research Article

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