Development of near isogenic lines (NILs) for leaf rust resistance utilizing advanced generation segregating lines of RIL population in wheat (Triticum aestivum L.)

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Ramesh Bhurta
Subhash Bijarania
Naman Raj
Anupama Singh
Ajay K. Chandra
Priyanka Agarwal
Hariom Shukla
Raghunandan K
Niharika Mallick
Vinod .
Shailendra K. Jha

Abstract

Near-isogenic lines (NILs) are useful genetic resources for basic genetic studies and further understanding of associated molecular
mechanisms. The NILs can be developed through standard methods like backcross breeding or advanced generation segregating
lines. The present study aimed the development of NILs for leaf rust resistance from the advanced generation segregating lines with
residual heterozygosity. Advanced generations segregating lines/heterogeneous inbred families (HIFs) segregating for contrasting
infection types (IT ;1 and 3) for leaf rust were identified from the recombinant inbred lines (RILs) between cross of T. timopheevii derivedintrogression line Selection G12, a resistant parent and a susceptible parent Agra local. The molecular analysis using polymorphic SSRmarkers between parents indicated a high level of similarity with 97.07 and 96.49% resemblance among the contrasting NIL pairs fromHIF1 and HIF5, respectively. These NILs may serve as valuable resources for conducting fine mapping and expression analysis of leafrust resistance in wheat and, therefore, will help to identify candidate gene(s) for leaf rust resistance in Selection G12

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How to Cite
Bhurta, R. ., Bijarania, S. ., Raj, N. ., Singh, A. ., Chandra, A. K. ., Agarwal, P. ., Shukla, H. ., K, R. ., Mallick, N. ., ., V., & Jha, S. K. . (2023). Development of near isogenic lines (NILs) for leaf rust resistance utilizing advanced generation segregating lines of RIL population in wheat (Triticum aestivum L.). INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, 83(04), 482–489. https://doi.org/10.31742/ISGPB.83.4.4
Section
Research Article

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